HEXS Application Data
Some Applications:
- Be in Beryllium Copper
- Identification of alloys
- Diffusion of O2 into metals
- Carbon content of steel
- Quality control of alloy content
- Identification of contaminants
- Cr monolayers on electroform mandrels
- Detecting surface oxidation on metals
- Cr passivation layers on stainless steel
- Segregation of components in steels, aluminums, brasses, and other alloys
- Precious metals, karat alloys, sterling, high purity
- Wafer Boron Dopant Analysis
- Film Analysis
- Strontium Titanate on Silicon
- Boron and Phosphorous in BPSG glass
- WSi Stoichiometry
- Oxide layer Stoichiometry
- TiN, TaN Stoichiometry
- Detection of surface oxidation
- TaSi2
- QC of tool coatings (TiN, TiAlN, etc)
- QC of optical coatings (TiO2) SiO, SiO2, InSnO, Au)
- Phosphorus and Boron content of electroless Ni
- Oxidation of coatings
- Solder coating: composition and homogeneity, intermetallic, oxide
- Connector coatings Au, Au-Co, Ni, Pd, Ag, Cd, Sn
- Magnetic media / data storage
- Read-Write Head (MR, GMR, Permalloys)
- Sputter, PVD target composition and impurity analysis
- Dopants in Sol-Gel Optics
- MgF
- Analysis of Stardust
- Comet Dust
HEXS Technical Data and Applications: Download PDFs
- WDS Elemental Characterization of Stainless Steels
- The L-Line Advantage
- Low Energy Spectroscopy of VOx
- Boron Depth Profiling
- Manganese Steel Analysis
- Wafer Dopant Analysis
- Thin Film Analysis
- Nitrided Steel Depth Profiling with HEXS
Parallax: Pioneering New X-Ray Perspective!

